DAK is designed to measure the dielectric properties of homogeneous and isotropic liquid, solid, and semi-solid materials. The sample volume should be large enough to ensure that reflections at the sample boundaries do not significantly influence the measurements. The minimum sample volume depends on the frequency, probe size, and dielectric parameters.
For data acquisition and visualisation the same graphical user interface is used for DAK, DAKS, and DAK-TL. For the measurement of thin layers, e.g., plastics and thin films, we developed enhanced algorithms which take into account the limited thickness of the material under test.
VNA control and data acqusition is different in the case of DAK-TL-P and DAK-TL-P². For TL-P the software needs complex reflection coefficient data, e.g., S11. For TL-P² transmission is measured in addition (S11 and S21). The list of supported VNAs for TL-P² are different.
Accuracy: advanced algorithms for fast, high-precision measurements
Enhanced visualization: view your choice of parameters (ε', ε", σ, tanδ, μ', μ'') in a variety of formats (linear, log, Smith chart, tabular)
Robust data analysis suite: fit data to analytical curves, compare data with target parameters, and view tolerance and uncertainty ranges
Flexible scripting: control equipment and data analysis with built-in Python interface