DAK is designed to measure the dielectric properties of homogeneous liquid, solid, and semi-solid materials. The sample volume should be large enough to ensure that reflections at the sample boundaries do not significantly influence the measurements. The minimum sample volume depends on the frequency, probe size, and dielectric parameters.
We are currently developing further enhancements for the measurement of thin layers, e.g., plastics and thin films. More information will be available soon.
Accuracy: advanced algorithms for fast, high-precision measurements
Enhanced visualization: view your choice of parameters (ε', ε", σ, tanδ) in a variety of formats (linear, log, Smith chart, tabular)
Robust data analysis suite: fit data to analytical curves, compare data with target parameters, and view tolerance and uncertainty ranges
Flexible scripting: control equipment and data analysis with built-in Python interface